X-Ray Diffraction Crystallography

X-Ray Diffraction Crystallography

AngličtinaPevná vazbaTisk na objednávku
Waseda Yoshio
Springer, Berlin
EAN: 9783642166341
Tisk na objednávku
Předpokládané dodání v pondělí, 27. ledna 2025
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Podrobné informace

X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
EAN 9783642166341
ISBN 3642166342
Typ produktu Pevná vazba
Vydavatel Springer, Berlin
Datum vydání 9. března 2011
Stránky 310
Jazyk English
Rozměry 235 x 155
Země Germany
Sekce Professional & Scholarly
Autoři Matsubara Eiichiro; Shinoda Kozo; Waseda Yoshio
Ilustrace XI, 310 p.