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Author: Rahman, M. Shahinur
Reliability Characteristics of Rare-earth oxides and Gate Stacks on Ge

Reliability Characteristics of Rare-earth oxides and Gate Stacks on Ge

Rahman, M. Shahinur
EnglishPaperback / softbackPrint on demand
LAP Lambert Academic Publishing
ISBN: 9783659451836
Print on demand
Delivery on Monday, 3. of February 2025
Print on demand
Delivery on Monday, 3. of February 2025
CZK 1,643 -10%