Advances in X-Ray Analysis

Advances in X-Ray Analysis

AngličtinaMěkká vazbaTisk na objednávku
Mueller William M.
Springer-Verlag New York Inc.
EAN: 9781468486391
Tisk na objednávku
Předpokládané dodání v pondělí, 27. ledna 2025
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Běžná cena: 2 925 Kč
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Podrobné informace

Consider for a few moments the staggering magnitude of technological advance which has occurred since the birth four centuries ago of that early progenitor of the scientific method, Galileo. Think also about the extent of scientific knowledge avail­ able during the lifetime of Galileo and his associates; knowledge increasing slowly through several centuries, accelerating rapidly during the past twenty years, culminat­ ing at the present time in a virtual impossibility that one person - one communit- possibly even one nation - can hope to generate or use productively more than a minute portion of the world's scientific knowledge. New developments - expanded technological concepts - occur with dazzling rapidity, often faster than they can be assimilated. At the same time there are practical limitations to the extent of formal education. Continuing education, upgrading of scientific know-how, retraining to assure full utilization of existing knowledge - these are urgent problems which today confront the nation's scientific community. And there is never enough time. The problem is compounded by the increasing burden of information retrieval.
EAN 9781468486391
ISBN 146848639X
Typ produktu Měkká vazba
Vydavatel Springer-Verlag New York Inc.
Datum vydání 26. dubna 2013
Stránky 662
Jazyk English
Rozměry 254 x 178
Země United States
Sekce Professional & Scholarly
Autoři Fay Marie; Mallett Gavin R.; Mueller William M.
Ilustrace X, 662 p. 212 illus., 4 illus. in color.
Edice Softcover reprint of the original 1st ed. 1964
Série Advances in X-Ray Analysis