Scattering of Electromagnetic Waves

Scattering of Electromagnetic Waves

AngličtinaPevná vazba
Tsang, Leung
John Wiley & Sons Inc
EAN: 9780471387992
Na objednávku
Předpokládané dodání ve čtvrtek, 30. ledna 2025
4 730 Kč
Běžná cena: 5 255 Kč
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Podrobné informace

A timely and authoritative guide to the state of the art of wave scattering
Scattering of Electromagnetic Waves offers in three volumes a complete and up-to-date treatment of wave scattering by random discrete scatterers and rough surfaces. Written by leading scientists who have made important contributions to wave scattering over three decades, this new work explains the principles, methods, and applications of this rapidly expanding, interdisciplinary field. It covers both introductory and advanced material and provides students and researchers in remote sensing as well as imaging, optics, and electromagnetic theory with a one-stop reference to a wealth of current research results. Plus, Scattering of Electromagnetic Waves contains detailed discussions of both analytical and numerical methods, including cutting-edge techniques for the recovery of earth/land parametric information.
The three volumes are entitled respectively Theories and Applications, Numerical Simulation, and Advanced Topics. In the first volume, Theories and Applications, Leung Tsang (University of Washington) Jin Au Kong (MIT), and Kung-Hau Ding (Air Force Research Lab) cover:
* Basic theory of electromagnetic scattering
* Fundamentals of random scattering
* Characteristics of discrete scatterers and rough surfaces
* Scattering and emission by layered media
* Single scattering and applications
* Radiative transfer theory and solution techniques
* One-dimensional random rough surface scattering
EAN 9780471387992
ISBN 0471387991
Typ produktu Pevná vazba
Vydavatel John Wiley & Sons Inc
Datum vydání 15. srpna 2000
Stránky 440
Jazyk English
Rozměry 243 x 160 x 26
Země United States
Sekce Professional & Scholarly
Autoři Ding Kung-Hau; Kong, Jin Au; Tsang, Leung
Edice 1. Auflage
Série Wiley Series in Remote Sensing and Image Processing