Data Mining: Know It All

Data Mining: Know It All

EnglishEbook
Chakrabarti, Soumen
Elsevier Science
EAN: 9780080877884
Available online
CZK 1,539
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Detailed information

This book brings all of the elements of data mining together in a single volume, saving the reader the time and expense of making multiple purchases. It consolidates both introductory and advanced topics, thereby covering the gamut of data mining and machine learning tactics ? from data integration and pre-processing, to fundamental algorithms, to optimization techniques and web mining methodology. The proposed book expertly combines the finest data mining material from the Morgan Kaufmann portfolio. Individual chapters are derived from a select group of MK books authored by the best and brightest in the field. These chapters are combined into one comprehensive volume in a way that allows it to be used as a reference work for those interested in new and developing aspects of data mining. This book represents a quick and efficient way to unite valuable content from leading data mining experts, thereby creating a definitive, one-stop-shopping opportunity for customers to receive the information they would otherwise need to round up from separate sources. - Chapters contributed by various recognized experts in the field let the reader remain up to date and fully informed from multiple viewpoints. - Presents multiple methods of analysis and algorithmic problem-solving techniques, enhancing the reader's technical expertise and ability to implement practical solutions. - Coverage of both theory and practice brings all of the elements of data mining together in a single volume, saving the reader the time and expense of making multiple purchases.
EAN 9780080877884
ISBN 0080877885
Binding Ebook
Publisher Elsevier Science
Publication date October 31, 2008
Language English
Country Uruguay
Authors Chakrabarti, Soumen; Cox, Earl; Frank, Eibe; Guting, Ralf Hartmut; Han, Jiawei; Jiang, Xia; Kamber, Micheline; Lightstone, Sam S.; Nadeau, Thomas P.; Neapolitan, Richard E.; Pyle, Dorian; Refaat, Mamdouh; Schneider, Markus; Teorey, Toby J.; Witten, Ian H.
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