Path Analysis and Genetic Parameter for Grain Yield in Bread Wheat

Path Analysis and Genetic Parameter for Grain Yield in Bread Wheat

EnglishPaperback / softback
Rajput, Rahul Singh
LAP Lambert Academic Publishing
EAN: 9786200092076
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Detailed information

The main objective of this book was to determine the correlation and path analysis of yield and yield contributing characters in bread wheat and to assess their suitability in a breeding plan. In agriculture, Path analysis has been used by plant breeders to assist in identifying traits that are useful as selection criteria to improve crop yield. Total correlation between yield and component traits may be sometimes misleading as it might be an over-estimate and under-estimate because of its association with other character. In this research, total correlation are splitted into direct and indirect effects of cause would give more meaningful interpretation to the cause of association between the dependent variable like yield and independent variable like yield component. This kind of information will be helpful in formulating the selection criteria, indicating the selection for desirable characters is likely to bring about on overall improvement in single plant yield directly.
EAN 9786200092076
ISBN 6200092079
Binding Paperback / softback
Publisher LAP Lambert Academic Publishing
Publication date May 23, 2019
Pages 60
Language English
Dimensions 229 x 152 x 4
Readership General
Authors Rajput, Rahul Singh