Unconventional Electron Microscopy for Molecular Structure Determination

Unconventional Electron Microscopy for Molecular Structure Determination

GermanPaperback / softback
Vieweg+Teubner
EAN: 9783528081171
On order
Delivery on Friday, 14. of February 2025
CZK 1,354
Common price CZK 1,504
Discount 10%
pc
Do you want this product today?
Oxford Bookshop Praha Korunní
not available
Librairie Francophone Praha Štěpánská
not available
Oxford Bookshop Ostrava
not available
Oxford Bookshop Olomouc
not available
Oxford Bookshop Plzeň
not available
Oxford Bookshop Brno
not available
Oxford Bookshop Hradec Králové
not available
Oxford Bookshop České Budějovice
not available
Oxford Bookshop Liberec
not available

Detailed information

Generally it is not sufficiently appreciated that electron microscopy is in fact a diffraction method. In essential aspects electron microscopes are more closely related to X-ray diffracto· meters than to light microscopes. In electron microscopes monochromatized radiation and coherent illumination (never used in light microscopy) correspond in X-ray diffractometers to the primary beam with a small divergence. Imaging ina general sense can take place in interference experiments between a primary beam and a scattered beam, or between diffe rent deflected scattered beams. This leads to the realization of an old dream in diffracto metry, namely to a general experimental solution of the "phase problem". The most im pressive analogy, however, concerns the potential of the electron microscope as a tool for structure determination (where the radiation wavelenght is smaller than the atomic distan ces). It was therefore considered timely to treat this topic in this series. It was a fortunate cioncidence that in 1976 a Workshop on "Unconventional Electron Microscope Methods for the Investigation of Molecular Structures" (sponsored by the European Molecular Biology Organisation, the Deutsche Forschungsgemeinschaft and the Max-Planck-Gesell schaft) took place, and that most speakers presenting introductory lectures agreed to publish their contributions in an expanded version in this volume. This volume is thus not a symposium report in the usual sense since it contains the majority of these introductory lectures only.
EAN 9783528081171
ISBN 3528081171
Binding Paperback / softback
Publisher Vieweg+Teubner
Publication date January 1, 1979
Pages 226
Language German
Dimensions 235 x 155
Country Germany
Readership General
Illustrations VI, 226 S. 130 Abb.
Editors Hoppe W.; Mason R.
Edition Softcover reprint of the original 1st ed. 1979
Series Advances in structure research by diffraction methods