Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

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Detailed information

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
EAN 9780120147861
ISBN 0120147866
Binding Hardback
Publisher Elsevier Science Publishing Co Inc
Publication date October 12, 2006
Pages 344
Language English
Dimensions 229 x 152
Country United States
Readership Professional & Scholarly
Authors Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)
Series Advances in Imaging and Electron Physics