Connections

Connections

EnglishHardback
Alesso H. Peter
John Wiley & Sons Inc
EAN: 9780470118818
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Detailed information

"In their fascinating analysis of the recent history of information technology, H. Peter Alesso and Craig F. Smith reveal the patterns in discovery and innovation that have brought us to the present tipping point. . . .

A generation from now, every individual will have personally tailored access to the whole of knowledge . . . the sooner we all begin to think about how we got here, and where we're going, the better. This exciting book is an essential

first step."
—From the Foreword by James Burke

Many people envision scientists as dispassionate characters who slavishly repeat experiments until "eureka"—something unexpected happens. Actually, there is a great deal more to the story of scientific discovery, but seeing "the big picture" is not easy. Connections: Patterns of Discovery uses the primary tools of forecasting and three archetypal patterns of discovery—Serendipity, Proof of Principle, and 1% Inspiration and 99% Perspiration—to discern relationships of past developments and synthesize a cohesive and compelling vision for the future. It challenges readers to think of the consequences of extrapolating trends, such as Moore's Law, to either reach real machine intelligence or retrench in the face of physical limitations. From this perspective,the book draws "the big picture" for the Information Revolution's innovations in chips, devices, software, and networks.

With a Foreword by James Burke and bursting with fascinating detail throughout, Connections: Patterns of Discovery is a must-read for computer scientists, technologists, programmers, hardware and software developers, students, and anyone with an interest in tech-savvy topics.

EAN 9780470118818
ISBN 0470118814
Binding Hardback
Publisher John Wiley & Sons Inc
Publication date February 5, 2008
Pages 224
Language English
Dimensions 241 x 163 x 20
Country United States
Readership Professional & Scholarly
Authors Alesso H. Peter; Smith Craig F.
Edition 1. Auflage
Series IEEE Press