Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

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Detailed information

Advances in Imaging and Electron Physics, Volume 200, the latest release in a series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and computing methods. Topics in this latest release include Past and Present Attempts to Attain the Resolution Limit of the Transmission Electron Microscope, Phase Plates for Transmission Electron Microscopy, and X-Ray Lasers in Biology: Structure and Dynamics.
EAN 9780128120903
ISBN 0128120908
Binding Hardback
Publisher Elsevier Science Publishing Co Inc
Publication date May 25, 2017
Pages 172
Language English
Dimensions 229 x 152
Country United States
Readership Professional & Scholarly
Authors Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)
Editors Hawkes, Peter W.
Series Advances in Imaging and Electron Physics