ISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysis

ISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysis

EnglishPaperback / softback
ASM International
A S M International
EAN: 9781627081504
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Detailed information

The theme for the November 2017 conference is Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
EAN 9781627081504
ISBN 162708150X
Binding Paperback / softback
Publisher A S M International
Publication date January 30, 2018
Pages 660
Language English
Dimensions 229 x 152
Country United States
Authors ASM International